1

FUNCTIONALITY FAULT MODEL: A BASIS FOR TECHNOLOGY-SPECIFIC TEST GENERATION

Année:
1998
Langue:
english
Fichier:
PDF, 267 KB
english, 1998
2

Test generation for technology-specific multi-faults based on detectable perturbations

Année:
2005
Langue:
english
Fichier:
PDF, 397 KB
english, 2005
4

Optimization of FPGA configurations using parallel genetic algorithm

Année:
2001
Langue:
english
Fichier:
PDF, 244 KB
english, 2001